Steven Yalisove

Professor

smy@umich.edu

2014 Gerstacker

T: (734) 764-4346

Bio

Projects

Publications

Facilities

Group


Publications

  1. Murphy, R, Abere, M, Zhang, H, Sun, H, Torralva, B, Mansfield, J, Kotov, N, and Yalisove, S (2012). Ultrafast laser orthogonal alignment and patterning of carbon nanotube-polymer composite filmsAppl. Phys. Lett., 101:203301 .

  2. Cahill, D and Yalisove, S (2006). Ultrafast lasers in materials researchMRS Bulletin, 31(8):594.

  3. Feng, Q, Picard, Y, McDonald, J, van Rompay, P, Yalisove, S, and Pollock, T (2006). Femtosecond laser machining of single-crystal superalloys through thermal barrier coatingsMaterials Science And Engineering A-Structural Materials Properties Microstructure And Processing, 430(1-2):203.

  4. McDonald, J, Mistry, V, Ray, K, and Yalisove, S (2006). Femtosecond pulsed laser direct write production of nano- and microfluidic channelsApplied Physics Letters, 88(18).

  5. McDonald, J, Mistry, V, Ray, K, Yalisove, S, Nees, J, and Moody, N (2006). Femtosecond-laser-induced delamination and blister formation in thermal oxide films on silicon (100)Applied Physics Letters, 88(15).

  6. Picard, Y, Adams, D, Palmer, J, and Yalisove, S (2006). Pulsed laser ignition of reactive multilayer filmsApplied Physics Letters, 88(14).

  7. Tull, B, Carey, J, Mazur, E, McDonald, J, and Yalisove, S (2006). Silicon surface morphologies after femtosecond laser irradiationMRS Bulletin, 31(8):626.

  8. Zhao, Z, Yalisove, S, and Bilello, J (2006). Stress anisotropy and stress gradient in magnetron sputtered films with different deposition geometriesJournal of Vacuum Science & Technology A, 24(2):195.

  9. Feng, Q, Picard, Y, Liu, H, Yalisove, S, Mourou, G, and Pollock, T (2005). Femtosecond laser micromachining of a single-crystal superalloyScripta Materialia, 53(5):511.

  10. McDonald, J, McClelland, A, Picard, Y, and Yalisove, S (2005). Role of a native oxide on femtosecond laser interaction with silicon (100) near the damage thresholdApplied Physics Letters, 86(26).

  11. Zhao, Z, Rek, Z, Yalisove, S, and Bilello, J (2005). Evolution of in-plane texture in reactively sputtered CrN filmsJournal of Applied Physics, 97(2).

  12. Zhao, Z, Rek, Z, Yalisove, S, and Bilello, J (2005). Nanostructured chromium nitride films with a valley of residual stressThin Solid Films, 472(1-2):96.

  13. Burnett, D, Gabelnick, A, Marsh, A, Lewis, H, Yalisove, S, Fischer, D, and Gland, J (2004). Defect enhanced carbon monoxide oxidation at elevated oxygen pressures on a Pt/Al2O3 thin filmJournal of Physical Chemistry B, 108(17):5314.

  14. Shyam, A, Picard, Y, Jones, J, Allison, J, and Yalisove, S (2004). Small fatigue crack propagation from micronotches in the cast aluminum alloy W319Scripta Materialia, 50(8):1109.

  15. Zhao, Z, Rek, Z, Yalisove, S, and Bilello, J (2004). In situ x-ray diffraction observation of multiple texture turnovers in sputtered Cr filmsJournal of Vacuum Science & Technology A, 22(6):2365.

  16. Zhao, Z, Rek, Z, Yalisove, S, and Bilello, J (2004). Phase formation and structure of magnetron sputtered chromium nitride films: in-situ and ex-situ studiesSurface & Coatings Technology, 185(1-3):329.

  17. Whitacre, J, Yalisove, S, and Bilello, J (2002). Real-time/in situ diffraction study of phase and microstructural evolution in sputtered beta-Ta/Ta2O5 films (vol 19, 2910, 2001)Journal of Vacuum Science & Technology A-Vacuum Surfaces And Films, 20(4):1505.

  18. Zhao, Z, Hershberger, J, Yalisove, S, and Bilello, J (2002). Determination of residual stress in thin films: a comparative study of X-ray topography versus laser curvature methodThin Solid Films, 415(1-2):21.

  19. Zhao, Z, Yalisove, S, Rek, Z, and Bilello, J (2002). Evolution of anisotropic microstructure and residual stress in sputtered Cr filmsJournal of Applied Physics, 92(12):7183.

  20. Whitacre, J, Yalisove, S, and Bilello, J (2001). Real-time/in situ diffraction study of phase and microstructural evolution in sputtered beta-Ta/Ta2O5 filmsJournal of Vacuum Science & Technology A-Vacuum Surfaces And Films, 19(6):2910.

  21. Kendig, L, Rek, Z, Yalisove, S, and Bilello, J (2000). The role of impurities and microstructure on residual stress in nanoscale Mo filmsSurface & Coatings Technology, 132(2-3):124.

  22. Cammarata, R, Bilello, J, Greer, A, Sieradzki, K, and Yalisove, S (1999). Stresses in multilayered thin filmsMRS Bulletin, 24(2):34.

  23. Malhotra, A, Whitacre, J, Zhao, Z, Hershberger, J, Yalisove, S, and Bilello, J (1998). An in situ ex situ X-ray analysis system for thin sputtered filmsSurface & Coatings Technology, 110(1-2):105.

  24. Whitacre, J, Rek, Z, Bilello, J, and Yalisove, S (1998). Surface roughness and in-plane texturing in sputtered thin filmsJournal of Applied Physics, 84(3):1346.

  25. Karpenko, O, Bilello, J, and Yalisove, S (1997). Growth anisotropy and self-shadowing: a model for the development of in-plane texture during polycrystalline thin-film growthJournal of Applied Physics, 82(3):1397.

  26. Karpenko, O, Yalisove, S, and Eaglesham, D (1997). Surface roughening during low temperature Si(100) epitaxyJournal of Applied Physics, 82(3):1157.

  27. Malhotra, S, Rek, Z, Yalisove, S, and Bilello, J (1997). Depth-sensitive strain analysis of a W-Ta-W trilayerThin Solid Films, 301(1-2):55.

  28. Malhotra, S, Rek, Z, Yalisove, S, and Bilello, J (1997). Analysis of thin film stress measurement techniquesThin Solid Films, 301(1-2):45.

  29. Malhotra, S, Rek, Z, Yalisove, S, and Bilello, J (1997). Strain gradients and normal stresses in textured Mo thin filmsJournal of Vacuum Science & Technology A-Vacuum Surfaces And Films, 15(1-2):345.

  30. Hershberger, J, Ying, T, Kustas, F, Fehrenbacher, L, Yalisove, S, and Bilello, J (1996). Residual stress, atomic structure, and growth morphology in B4C/SiC multilayer coatingsSurface & Coatings Technology, 87-8(1-3):237.

  31. Karpenko, O and Yalisove, S (1996). CoSi2 heteroepitaxy on patterned Si(100) substratesJournal of Applied Physics, 80(11):6211.

  32. Malhotra, A, Yalisove, S, and Bilello, J (1996). Growth and characterization of Ta/W multiscalar multilayer composite filmsThin Solid Films, 286(1-2):196.

  33. Malhotra, S, Rek, Z, Yalisove, S, and Bilello, J (1996). Depth dependence of residual strains in polycrystalline Mo thin films using high-resolution x-ray diffractionJournal of Applied Physics, 79(9):6872.

  34. Adams, D, Parfitt, L, Bilello, J, Yalisove, S, and Rek, Z (1995). Microstructure and Residual-Stress of Very Thin Mo FilmsThin Solid Films, 266(1):52.

  35. Bilello, J, Yalisove, S, and Rek, Z (1995). The Evolution of Texture In Thin-Films and Multilayers Via Synchrotron Transmission Laue and Grazing-Incidence X-Ray-ScatteringJournal of Physics D-Applied Physics, 28(4A):A295.

  36. Olk, C, Yalisove, S, and Doll, G (1995). Defect-Induced Absorption-Band-Edge Values In Beta-Fesi2Physical Review B, 52(3):1692.

  37. Olk, C, Yalisove, S, Heremans, J, and Doll, G (1995). Negative Magnetoresistance As a Result of Hopping Conduction In Polycrystalline Thin-Films of Beta-FeSi2Physical Review B, 52(7):4643.

  38. Srolovitz, D, Yalisove, S, and Bilello, J (1995). Design of Multiscalar Metallic Multilayer Composites For High-Strength, High Toughness, and Low Cte MismatchMetallurgical And Materials Transactions A-Physical Metallurgy And Materials Science, 26(7):1805.

  39. Vill, M, Adams, D, Yalisove, S, and Bilello, J (1995). Mechanical-Properties of Tough Multiscalar MicrolaminatesActa Metallurgica Et Materialia, 43(2):427.

  40. Vill, M, Rek, Z, Yalisove, S, and Bilello, J (1995). Growth Textures of Thick Sputtered Films and Multilayers Assessed Via Synchrotron Transmission LaueJournal of Applied Physics, 78(6):3812.

  41. Adams, D and Yalisove, S (1994). Low-Temperature Homoepitaxial Growth on Nonplanar Si SubstratesJournal of Applied Physics, 76(9):5185.

  42. Adams, D, Yalisove, S, and Eaglesham, D (1994). Interfacial and Surface Energetics of Cosi2Journal of Applied Physics, 76(9):5190.

  43. Karpenko, O, Bilello, J, and Yalisove, S (1994). Combined Transmission Electron-Microscopy and X-Ray Study of The Microstructure and Texture In Sputtered Mo FilmsJournal of Applied Physics, 76(8):4610.

  44. Karpenko, O, Olk, C, Yalisove, S, Mansfield, J, and Doll, G (1994). Structural Investigation of Fe Silicide Films Grown By Pulsed-Laser DepositionJournal of Applied Physics, 76(4):2202.

  45. Olk, C, Karpenko, O, Yalisove, S, Doll, G, and Mansfield, J (1994). Growth of Epitaxial Beta-Fesi2 Thin-Films By Pulsed-Laser Deposition on Silicon(111)Journal of Materials Research, 9(11):2733.

  46. Adams, D, Vill, M, Tao, J, Bilello, J, and Yalisove, S (1993). Controlling Strength and Toughness of Multilayer Films - A New Multiscalar ApproachJournal of Applied Physics, 74(2):1015.

  47. Adams, D, Yalisove, S, and Eaglesham, D (1993). Effect of Hydrogen on Surface Roughening During Si Homoepitaxial GrowthApplied Physics Letters, 63(26):3571.

  48. Eaglesham, D, Unterwald, F, Luftman, H, Adams, D, and Yalisove, S (1993). Effect of H on Si Molecular-Beam EpitaxyJournal of Applied Physics, 74(11):6615.

  49. Loretto, D, Gibson, J, and Yalisove, S (1990). Reconstruction of Heterointerfaces In Mbe - Cosi2(001) on Si(001)Thin Solid Films, 184:309.

  50. Vandenberg, J, White, A, Hull, R, Short, K, and Yalisove, S (1990). Anisotropic Strain Relaxation In Buried Cosi2 Layers Formed By MesotaxyJournal of Applied Physics, 67(2):787.

  51. Headrick, R, Konarski, P, Yalisove, S, and Graham, W (1989). Medium-Energy Ion-Scattering Study of The Initial-Stage of Oxidation of Fe(001)Physical Review B, 39(9):5713.

  52. Loretto, D, Gibson, J, and Yalisove, S (1989). Evidence For a Dimer Reconstruction At a Metal-Silicon InterfacePhysical Review Letters, 63(3):298.

  53. Tung, R, Batstone, J, and Yalisove, S (1989). Si/CoSi2/Si Structures - Pseudomorphism, Interface Structures, Epitaxial Orientations, and The Control of PinholesJournal of The Electrochemical Society, 136(3):815.

  54. Tung, R, Schrey, F, and Yalisove, S (1989). Homoepitaxial Growth of CoSi2 and NiSi2 on (100) and (110) Surfaces At Room-TemperatureApplied Physics Letters, 55(19):2005.

  55. Yalisove, S, Eaglesham, D, and Tung, R (1989). Single-Crystal Growth of CoSi2(110) on Si(110)Applied Physics Letters, 55(20):2075.

  56. Yalisove, S, Tung, R, and Loretto, D (1989). Epitaxial Orientation and Morphology of Thin CoSi2 Films Grown on Si(100) - Effects of Growth-ParametersJournal of Vacuum Science & Technology A-Vacuum Surfaces And Films, 7(3):1472.

  57. Yalisove, S and Graham, W (1988). Medium-Energy Ion-Scattering Studies of Relaxation At Metal-SurfacesJournal of Vacuum Science & Technology A-Vacuum Surfaces And Films, 6(3):588.

  58. Yalisove, S and Graham, W (1987). Multilayer Rippled Structure of The Nial(110) Surface - a Medium Energy Ion-Scattering StudySurface Science, 183(3):556.

  59. Copel, M, Gustafsson, T, Graham, W, and Yalisove, S (1986). Medium-Energy Ion-Scattering Analysis of The Cu(110) SurfacePhysical Review B, 33(12):8110.

  60. Graham, W, Yalisove, S, Adams, E, Gustafsson, T, Copel, M, and Tornqvist, E (1986). Comparison of Solid-State and Electrostatic Particle-Detection In Medium Energy Ion-Scattering With Channeling and BlockingNuclear Instruments & Methods In Physics Research Section B-Beam Interactions With Materials And Atoms, 16(37350):383.

  61. Yalisove, S, Graham, W, Adams, E, Copel, M, and Gustafsson, T (1986). Multilayer Relaxations of Ni(110) - New Medium Energy Ion-Scattering ResultsSurface Science, 171(2):400.

  62. Copel, M, Graham, W, Gustafsson, T, and Yalisove, S (1985). Ion-Scattering Study of The Lithium Induced Reconstruction of Cu(110)Solid State Communications, 54(8):695.

  63. White, C, Padgett, R, Liu, C, and Yalisove, S (1985). Surface and Grain-Boundary Segregation In Relation To Intergranular Fracture - Boron and Sulfur In Ni3AlJournal of Metals, 37(8):A8.

  64. White, C, Padgett, R, Liu, C, and Yalisove, S (1984). Surface and Grain-Boundary Segregation In Relation To Intergranular Fracture - Boron and Sulfur In Ni3AlScripta Metallurgica, 18(12):1417.

  65. Gans, R and Yalisove, S (1982). Observations and Measurements of Flow In a Partially-Filled Horizontally Rotating CylinderJournal of Fluids Engineering-Transactions of The Asme, 104(3):363.

  66. Gans, R and Yalisove, S (1978). Flow Measurements In a Partially-Filled Rotating CylinderBulletin of The American Physical Society, 23(8):989.

  67. No names specified (). .