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METHOD:PUBLISH
BEGIN:VEVENT
DTSTAMP:20260609T230935Z
CREATED:20130110T183003Z
UID:ATEvent-c4fac48b1b6340019d1c341cee46e328
LAST-MODIFIED:20130110T183006Z
SUMMARY:Neutrons for Soft Materials Manufacturing: Measuring the Next Level of Structural and Rheological Complexity
DTSTART:20130412T193000Z
DTEND:20130412T210000Z
DESCRIPTION:Ronald Jones
LOCATION:1670 Beyster Building
CONTACT:National Institute of Standards and Technology
URL:http://www.nist.gov/mml/msed/electronics_materials/ronaldjones.cfm
CLASS:PUBLIC
END:VEVENT
END:VCALENDAR