Strain rate sensitivity and activation volume of Cu/Ni metallic multilayer thin films measured via micropillar compression

Amit Misra

Professor and Department Chair

amitmis@umich.edu

3062B H.H. Dow

T: (734) 763-2445

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J.S. Carpenter, A. Misra, M.D. Uchic, and P.M. Anderson (2012)

Applied Physics Letters, 101(5).

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