Comparison of X-ray analysis methods used to determine the grain size and strain in nanocrystalline materials

Michael Atzmon

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atzmon@umich.edu

2933 Cooley

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HH Tian and M Atzmon (1999)

Philos. Mag. A-Phys. Condens. Matter Struct. Defect Mech. Prop., 79(8):1769.

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