Extended Depth of Field for High-Resolution Scanning Transmission Electron Microscopy

Robert Hovden

Assistant Professor

hovden@umich.edu

2110 H.H. Dow

T: (734) 764-3949

Bio

Publications


R. Hovden, H. L Xin, and D. A Muller (2011)

Microscopy and Microanalysis, 17(1):75-80.

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