Periodic Artifact Reduction in Fourier Transforms of Full Field Atomic Resolution Images

Robert Hovden

Assistant Professor

hovden@umich.edu

2110 H.H. Dow

T: (734) 764-3949

Bio

Publications


R. Hovden, Y. Jiang, H. LL Xin, and L. F Kourkoutis (2015)

Microscopy and Microanalysis, 21(2):436-441.

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