Aaron Dehne

Joanna Millunchick

adehne@umich.edu


Aaron focus included a little of everything from devising new methods to get sharp STM tips and plate BFM filaments, so they will not break in situ, to characterization and analysis of Quantum Dots made by patterning with a Focused Ion beam and then growth by MBE. He is currently working at the US Patent and Trademark Office in Washington D.C. as a patent examiner in the field of semiconductors, mainly with methods of manufacturing.