Joanna Millunchick


2014 HH Dow

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Thin GaAs films grown on lattice-matched In0.53Ga0.47As/InP(001) have been imaged by in vacuo scanning tunneling microscopy. We observe that the morphological evolution of these strained films depends on the deposition and diffusion of group III adatoms and the incorporation of As from the vapor, in addition to Asaro-Tiller-Grinfeld instabilities. We compare step edge densities to a model for the Ga adatom density and find that the absolute magnitude of the group V and group III fluxes has a strong effect on the number of adatoms on the surface, and thus the morphology of the films.