X-ray diffraction measurement of segregation-induced interface broadening in InxGa1-xAs/GaAs superlattices

Joanna Millunchick

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joannamm@umich.edu

2014 HH Dow

T: (734) 647-8980

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P. Yashar, M. R Pillai, J. Mirecki-Millunchick, and S. A Barnett (1998)

J. Appl. Phys, 83(20).

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