Kai Sun

Research Scientist


2600 Draper Avenue, NAME Building RM124
T: (734) 936-3353





Research Facilities

Bruker Dimension Icon Atomic Force Microscope
Location: Room G022, Building 22 of The North Campus Research Complex

Atomic force microscopy (AFM), scanning force microscopy (SFM) is a high-resolution microscopic technique where the microscopic information is gathered by "feeling" the surface with a mechanical probe. Piezoelectric scanners facilitate (in x,y and z directions) tiny, but accurate, movements to enable very precise scanning. With demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit, AFM has become a standard technique for surface analysis of materials.

Some of these applications may require the purchase of special cantilevers, cantilever holders, etc.

  • Contact AFM
  • Tapping AFM
  • Lateral Force AFM
  • STM (needs a tip holder)
  • Magnetic Force Microscopy
  • Veeco's ScanAsyst / PeakForce Tapping
  • Fluid Imaging
  • Veeco's QNM (nanomechanical mapping)
  • Surface Potential / Scanning Kelvin Probe Microscopy
  • Phase Imaging
  • LiftMode (enables MFM/EFM)
  • Force curve and pulling
  • Torsional Resonance Mode
  • Piezo Response
Thermo-Fisher Nova Nanolab Dualbeam Focussed Ion Beam Workstation and Scanning Electron Microscope
Location: Room G023, Building 22 of The North Campus Research Complex
  • 1.1 nm @ 15 kV (TLD-SE)
  • 2.5 nm @ 1 kV (TLD-SE)
  • 3.5 nm @ 500V (TLD-SE)
Thermo-Fisher Helios 650 Xe Plasma FIB/SEM
Location: Room G021, Building 22 of The North Campus Research Complex
  • High resolution SEM Imaging (features <10 nm)
  • Large feature cross sections (>100 um)
  • Polishing of delicate samples for imaging and EBSD
  • FIB tomography serial sectioning for 3D reconstruction
  • FIB tomography for 3D EDS reconstructions
  • TEM and APT specimen preparation of Ga sensitive materials 
Thermo-Fisher Talos F200X G2 STEM/TEM
Location: Room G024, Building 22 of The North Campus Research Complex
  • Conventional TEM bright-field/dark-field imaging, electron diffraction, and high-resolution TEM
  • Z-contrast and high-resolution STEM imaging
  • Fast EDS elemental mapping
  • Tilting series with TEM/STEM/EDS capability and 3D reconstruction
  • Differential phase contrast (DPC) imaging and Lorentz microscopy for magnetic or polarized materials
Thermo-Fisher Spectra 300 Probe-Corrected S/TEM
Location: Room G032, Building 22 of The North Campus Research Complex
  • Super high resolution HAADF/LAADF/ABF/BF-STEM imaging
  • High resolution iDPC imaging for light elements
  • DPC and Lorentz microscopy for magnetic and polarized materials
  • Fast EDS elemental mapping with Dual-X
  • Fast EELS mapping and EFTEM with Gatan K3 direct detection camera
  • High energy resolution monochromated EELS
  • 4D-STEM for strain/phase/orientation/field mapping, DPC, and ptychography
Thermo-Fisher Tecnai G2 F30 in-situ ion irradiation TEM
Location: MIBL, NAME 120
  • The microscope is interfaced with a particle accelerator and a low energy ion source. 
  • Two separate ion species can be mixed and delivered to the TEM stage for in-situ irradiation experiments
Kratos Axis Ultra X-ray Photoelectron Spectroscopy
Location: Room G019, Building 22 of The North Campus Research Complex

X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA), uses soft X-rays to produce photoelectrons from the surface layers of atoms in a solid sample. The emitted electrons are analyzed according to their kinetic energy and the spectrum so produced is used to identify the elements present and their chemical states.

  • Spectrum mode: Using the monochromated Al source: 2 x 1 mm with energy resolution ~0.5ev.
  • Small area spectroscopy: ~ several µm.
  • Imaging mode: ~ 900µm x 900µm with spatial resolution ~ 6µm.