Cs oxide aggregation in SIMS craters in organic samples for optoelectronic application

John Kieffer

Professor

kieffer@umich.edu

2018 HH Dow

T: (734) 763-2595

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KQ Ngo, P Philipp, J Kieffer, and T Wirtz (2012)

Surface Science, 606:1244-1251.

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