Ag-Organic Layered Samples for Optoelectronic Applications: Interface Width and Roughening Using a 500 eV Cs+ Probe in Dynamic Secondary Ion Mass Spectrometry

Max Shtein

Professor

mshtein@umich.edu

3051W NCRC, Building 28

T: (734) 764-4312

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Patrick Philipp, Quyen, K Ngo, Max Shtein, John Kieffer, and Tom Wirtz (2013)

ANALYTICAL CHEMISTRY, 85(1):381-388.

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