In situ x-ray diffraction observation of multiple texture turnovers in sputtered Cr films

Steven Yalisove

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smy@umich.edu

2014 Gerstacker

T: (734) 764-4346

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ZB Zhao, ZU Rek, SM Yalisove, and JC Bilello (2004)

Journal of Vacuum Science & Technology A, 22(6):2365.

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