When 3:30 PM - 5:00 PM Oct 22, 2015
Where Ford Library
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The 2015 Van Vlack Lecture Series: Watching Microstructure Evolve in Three Dimensions

Peter W. Voorhees
Northwestern University

The microstructure-properties link is at the core of the materials science and engineering paradigm. Understanding the factors controlling the formation of microstructure in an engineering material has been hampered by the inability to record the evolution of a microstructure as a function of time. With the advent of high-energy x-ray sources it is now possible to follow microstructural evolution in three dimensions and as a function of time (4D). The ability to observe and quantify the evolution of a microstructure provides fundamentally new insights into this complex process. This is especially true of those microstructures that are produced during solidification. 4D x-ray tomography provides new insights into dendritic growth in technologically relevant metallic alloys, and shows the importance of crystal defects in the growth of Si particles from Al-Si melts. The big-data challenge associated with these experiments, and the important role of computer simulation will also be discussed.


The Van Vlack Lecture Series was established in honor of L. H. Van Vlack, to provide a distinguished lecture series from the outstanding leaders in the field of Materials Science and Engineering

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