Materials Science & Engineering

Hanawalt XMAL

J.D. Hanawalt X-Ray MicroAnalysis Laboratory

The MSE department X-ray characterization facilities are located in 2219 HH Dow. Now known as the J.D. Hanawalt XMAL (X-ray MicroAnalysis Laboratory), the goal is to provide state-of-the-art nanostructural characterization capabilities to members of the University of Michigan materials community.  Instrument sign-up and time recording system similar to that that has been in place at EMAL. In addition to our Rigaku rotating anode system and Bede high resolution diffractometer, we have also added a D8 Discover system with an x-y-z translation stage, video imaging system, and fine-focused optics. The safety and operation of the equipment is overseen by Ying Qi, MSE Department Engineer.

If you are trained on XMAL equipment you can reserve time.

 

Instrument Rates:

University of Michigan rate: $39.52/hour

Other University rate: $60/hour

External rate: $125/hour

 

Instrument Overview:

 

Rigaku SmartLab X-Ray Diffractometer
Rigaku SamrtLab system is multipurpose θ/θ X-Ray Diffractometer with fully automated computer control alignment. It can be used for General powder diffraction, Texture measurements, Stress analysis, thin film diffraction. XRR, Triple axis measurement, in-plane measurement and SAXS.  Also in-situ XRD studies at temperature 25°C~1100°C or -100°C~350°C is possible with Heating/Cooling Stage attachment.
Features:
  • 2.2KW Long-Fine Focus X-Ray tube
  • Full automated alignment under computer control
  • Focusing and Parallel beam geometries without reconfiguration
  • D/teX Ultra 250 High Speed Silicon Strip 1D Detector
  • Scintillation Detector
  • In-Plane Diffraction Attachment
  • Ge(220) 2 bounce incident Beam Monochromator 
  • Ge(220) 2 Analyzer
  • Anton Paar DHS1100 Domed hot stage
  • Anton Paar DCS350 Domed Cooling/Heating Stage
  • Battery Cell Attachment
  • SASX Attachment
Rigaku MiniFlex 600 Benchtop X-ray Diffraction System:
  • High-frequency, 0.60 kW (40 kV and 15 mA)
  • Measuring range: -3° to ~ 145° 2θ
  • Scanning speed: 0.01° - 100° 2θ / min
  • Scintillation Counter Detector 
  • Diffracted Beam Monochromator for Cu Radiation
  • MiniFlex Guidance Software
Supermini200 Benchtop WD-XRF Spectrometer:
  • 200 Watt End Window X-ray Tube, Pd Target
  • 12-Position Automatic Sample Changer
  • Zr Automatic Primary Beam Filter
  • 3 Crystal Exchanger (LiF(200) ,PET, RX-25 Multilayer)
  • High Precision Goniometer with Temperature Stabilizer
  • Flow-Proportional Counter (F-PC) Detector
  • Scintillation Counter (SC) Detector
  • ZSX Control, Measurement & Analysis Software