Hanawalt XMAL
The MSE department’s X-ray characterization facilities are in 2219 H.H. Dow. Known as the J.D. Hanawalt XMAL (X-ray MicroAnalysis Laboratory), the goal is to provide state-of-the-art nanostructural characterization capabilities to members of the University of Michigan materials community. In addition to our Rigaku MiniFlex XRD and Rigaku Supermini 200 XRF, we have a Rigaku SmartLab XRD equipped with a HyPix-3000 detector, which enables the acquisition of 2D diffraction patterns and the automated alignment within SmartLab Studio II software. Xiang Gao, MSE Research Engineer, oversees the safety and operation of the equipment.
If you are trained on XMAL equipment you can reserve time.
Instrument Rates:
University of Michigan rate: $38.45/hour
Other University rate: $60/hour
External rate: $125/hour
Instrument Overview:
Rigaku SmartLab X-Ray Diffractometer
The Rigaku SmartLab is a versatile X-ray diffractometer designed for advanced characterization of materials. It features fully automated, computer-controlled alignment, enabling precise and reproducible measurements. The instrument supports θ/2θ scans for powder diffraction using a Bragg-Brentano geometry and 2θ/ω scans for thin film analysis in Parallel Beam geometry. With this system, a wide range of measurements can be performed on powder, bulk, and thin film samples. Available capabilities include general Bragg-Brentano and Parallel Beam diffraction, residual stress analysis, high-resolution X-ray diffraction (HR-XRD), grazing incidence X-ray diffraction (GIXRD), X-ray reflectivity (XRR), rocking curve measurements, small-angle X-ray scattering (SAXS) in both transmission and reflection modes, micro-area two-dimensional diffraction, pole figure analysis, reciprocal space mapping, and both in-plane and out-of-plane measurements. Additionally, the system enables in-situ experiments at controlled high or low temperatures, providing researchers and students with comprehensive tools for investigating the structure and properties of materials.
Features:
- 3 kW long-fine focus sealed X-Ray tube Cu target
- Full automated alignment under computer control
- The CBO unit permits the switching between BB and PB geometries without reconfiguration
- Hypix-3000 semiconductor 2D detector with high spatial resolution and high-count rate
- Scan mode: θ/2θ, 2θ/ω
- Ge (220) 2 bounce incident Beam Monochromator
- Ge (220) 2 Analyzer
- Chi-Phi stage with triple-axis measurement
- In-Plane Diffraction Attachment
- Anton Paar DHS1100 Domed Hot Stage (25°C-1100°C)
- Anton Paar DCS350 Domed Cooling/Heating Stage (-100°C-350°C)
- Battery Cell Attachment
- SAXS Attachment
RIGAKU MINIFLEX 600 BENCHTOP X-RAY DIFFRACTOMETER
- High-frequency, X-ray tube Cu target with 600 W (40 kV and 15 mA)
- Scan mode: θ/2θ
- Scan range: 3°-140°, 2θ
- Scan speed: 0.01°-24°, 2θ/min
- Scintillation Counter Detector
- Graphite Monochromator to filter Kβ
- MiniFlex Guidance Software
SUPERMINI200 BENCHTOP WD-XRF SPECTROMETER
- 200 W End Window Pd Target X-ray Tube
- 12-Position Automatic Sample Changer
- Zr200 Automatic Primary Beam Filter
- 3 Crystal Exchanger: LiF (200), PET, and RX-25 Multilayer
- High Precision Goniometer with Temperature Stabilizer
- Scan range for elements: F to U
- Flow-Proportional Counter (F-PC) Detector for lighter elements
- Scintillation Counter (SC) Detector for heavier elements
- ZSX Control, Measurement & Analysis Software