When 10:00 AM - 11:30 AM Oct 01, 2008
Where 1690 CSE
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State-of-the-Art in Secondary Ion Mass Spectrometry

Tom Wirtz, Centre de Recherche Public Gabriel Lippmann, Luxembourg

The CRP Gabriel Lippmann possesses significant competence in the surface analysis of materials. Its facilities include various types of secondary ion mass spectrometry (SIMS) instruments, and researchers at this laboratory are also actively pursuing the development new and improved strategies for carrying out SIMS analyses. Dr. Wirtz is visiting Ann Arbor in the context kicking off a new collaborative Materials World Network project between the CRP Gabriel Lippmann and the Department of Materials Science and Engineering at the University of Michigan. On this occasion he has offered to give a general overview presentation of the SIMS technique. The presentation will include an introduction to the principles that underlie the SIMS analysis, a comparison between the various types of SIMS methodologies, along with a discussion of their respective advantages and disadvantages, and a description of the designs of several SIMS instruments that are commercially available to date. Current SIMS capabilities will be illustrated using examples of research carried out at the CRP Gabriel Lippmann. The presentation is intended to be informal, with ample time for questions and answers.