Kai Sun

Associate Research Scientist

kaisun@umich.edu

2800 Plymouth Road, NCRC Building 22 G013

T: (734) 936-3353

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Bruker Dimension Icon Atomic Force Microscope

Location: Room G022, Building 22 of The North Campus Research Complex

Atomic force microscopy (AFM), scanning force microscopy (SFM) is a high-resolution microscopic technique where the microscopic information is gathered by "feeling" the surface with a mechanical probe. Piezoelectric scanners facilitate (in x,y and z directions) tiny, but accurate, movements to enable very precise scanning. With demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit, AFM has become a standard technique for surface analysis of materials.

Some of these applications may require the purchase of special cantilevers, cantilever holders, etc.

  • Contact AFM
  • Tapping AFM
  • Lateral Force AFM
  • STM (needs a tip holder)
  • Magnetic Force Microscopy
  • Veeco's ScanAsyst / PeakForce Tapping
  • Fluid Imaging
  • Veeco's QNM (nanomechanical mapping)
  • Surface Potential / Scanning Kelvin Probe Microscopy
  • Phase Imaging
  • LiftMode (enables MFM/EFM)
  • Force curve and pulling
  • Torsional Resonance Mode
  • Piezo Response