Bruker Dimension Icon Atomic Force Microscope

Atomic force microscopy (AFM), scanning force microscopy (SFM) is a high-resolution microscopic technique where the microscopic information is gathered by "feeling" the surface with a mechanical probe. Piezoelectric scanners facilitate (in x,y and z directions) tiny, but accurate, movements to enable very precise scanning. With demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit, AFM has become a standard technique for surface analysis of materials.

Some of these applications may require the purchase of special cantilevers, cantilever holders, etc.

• Contact AFM
• Tapping AFM
• Lateral Force AFM
• STM (needs a tip holder)
• Magnetic Force Microscopy
• Veeco's ScanAsyst / PeakForce Tapping
• Fluid Imaging
• Veeco's QNM (nanomechanical mapping)
• Surface Potential / Scanning Kelvin Probe Microscopy
• Phase Imaging
• LiftMode (enables MFM/EFM)
• Force curve and pulling
• Torsional Resonance Mode
• Piezo Response

Thermo-Fisher Nova Nanolab Dualbeam Focussed Ion Beam Workstation and Scanning Electron Microscope

• 1.1 nm @ 15 kV (TLD-SE)
• 2.5 nm @ 1 kV (TLD-SE)
• 3.5 nm @ 500V (TLD-SE)

Thermo-Fisher Helios 650 Xe Plasma FIB/SEM

• High resolution SEM Imaging (features <10 nm)
• Large feature cross sections (>100 um)
• Polishing of delicate samples for imaging and EBSD
• FIB tomography serial sectioning for 3D reconstruction
• FIB tomography for 3D EDS reconstructions
• TEM and APT specimen preparation of Ga sensitive materials 

Thermo-Fisher Talos F200X G2 STEM/TEM

• Conventional TEM bright-field/dark-field imaging, electron diffraction, and high-resolution TEM
• Z-contrast and high-resolution STEM imaging
• Fast EDS elemental mapping
• Tilting series with TEM/STEM/EDS capability and 3D reconstruction
• Differential phase contrast (DPC) imaging and Lorentz microscopy for magnetic or polarized materials

Thermo-Fisher Spectra 300 Probe-Corrected S/TEM

• Super high resolution HAADF/LAADF/ABF/BF-STEM imaging
• High resolution iDPC imaging for light elements
• DPC and Lorentz microscopy for magnetic and polarized materials
• Fast EDS elemental mapping with Dual-X
• Fast EELS mapping and EFTEM with Gatan K3 direct detection camera
• High energy resolution monochromated EELS
• 4D-STEM for strain/phase/orientation/field mapping, DPC, and ptychography

Thermo-Fisher Tecnai G2 F30 in-situ ion irradiation TEM

• The microscope is interfaced with a particle accelerator and a low energy ion source. 
• Two separate ion species can be mixed and delivered to the TEM stage for in-situ irradiation experiments

Kratos Axis Ultra X-ray Photoelectron Spectroscopy

X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA), uses soft X-rays to produce photoelectrons from the surface layers of atoms in a solid sample. The emitted electrons are analyzed according to their kinetic energy and the spectrum so produced is used to identify the elements present and their chemical states.

• Spectrum mode: Using the monochromated Al source: 2 x 1 mm with energy resolution ~0.5ev.
• Small area spectroscopy: ~ several µm.
• Imaging mode: ~ 900µm x 900µm with spatial resolution ~ 6µm.