Kai Sun

Associate Research Scientist


2800 Plymouth Road, NCRC Building 22 G013

T: (734) 936-3353





JEOL 3011 High Resolution Electron Microscope

Location: Room G024, Building 22 of The North Campus Research Complex

High Resolution Electron Microscopy is phase contrast microscopy of the atomic structure of materials. Specimen stages in these instruments are typically in the high-stability, top-entry configuration. An image intensified TV system allows the observation of the structure images on a TV screen prior to the recording of micrographs. Dynamic experiments are usually recorded onto video tape. A computer controlled image acquisition and analysis package is invaluable for the capture and storage of images of both on-line and off-line analysis and comparison with images calculated with multislice algorithims.

  • Objective Current Stability: 1ppm/minute
  • Objective Focal Length: 2.5 mm
  • Spherical Aberration Coef. (Cs): 0.6 mm
  • Chromatic Aberration Coef. (Cc): 1.3 mm
  • Minimum Focus Step: 1 nm
  • Point-to-Point Resolution: 0.17 nm
  • Lattice Resolution: 0.14 nm