Kai Sun

Associate Research Scientist

kaisun@umich.edu

2800 Plymouth Road, NCRC Building 22 G013

T: (734) 936-3353

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JEOL 2010F Analytical Electron Microscope

Location: Room G020, Building 22 of The North Campus Research Complex

Analytical Electron Microscopy is a generic term that is applied to any study where a variety of analysis techniques are used within one particular microscope. These techniques typically include X-ray Energy Dispersive Spectroscopy (XEDS), Electron Energy Loss Spectroscopy (EELS), Selected Area Electron Diffraction (SAED), Convergent Beam Electron Diffraction (CBED), Scanning Transmission Electron Microscopy, and Scanning Electron Microscopy.

  • XEDS, PEELS, EFTEM, SAED, NBED, CBED, HREM, STEM, HAADF, Spectrum image/Image spectrum, Diffraction Contrast Imaging
  • CTEM 0.10 nm lattice / 0.25 nm point-to-point
  • STEM 0.17 nm