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- In Situ Stress Measurements via Wafer Curvature Detection Technology
- FIB-fabricated Ga Nanonots=> VLS Growth of GaN Nanopillars
- Wafer Bonding and Ion Cut Synthesis
- Mechanisms of Nitrogen Incorporation in GaAsN Alloys
- Prof. Matthew Beck
- Dr. Chad Gallinat
- Jordan Occena
- Davide Del Gaudio
- Timothy Jen
- Dr. Gülin Vardar
- Weifeng Ye
- Dr. Alex Lin
- Julia Trombley
- Christian Greenhill
- Hongling Lu
- James Delaney
- Anri Sorel
- Brandon Carter
- Ethan Lu